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Upcoming Events:

Date: August 16-22, 2015

IEEE International EMC Symposium Dresden 2015




Date: Tuesday, April 14, 2015

5:30pm: Networking/light dinner
6:30pm: Presentation
7:45pm: Adjourn

Water and soft drinks are free. Light dinner is available for a small fee.

Location: SIEMIC test lab

Title

DC-DC voltage converter switching noise – coupling mechanisms and mitigation approaches

Speaker

Xiaoning Ye, Intel

Abstract

In this presentation, various DC-DC voltage converter switching noise coupling mechanisms will be discussed. Practical design examples with noise coupling issues will be demonstrated and noise mitigation approaches will be discussed as well. In addition, near field scanning results will be provided to reveal the hot spots with switching noise. Simulation methodologies, as well as design guidelines on how to avoid switching noise will also be addressed in details in the presentation.

Biography

Xiaoning Ye

Xiaoning Ye is currently a Principal Engineer at Intel Corporation, working on signal integrity of high speed interconnects in Server systems. He received his Bachelor and Master Degrees in electronics engineering from Tsinghua University, Beijing, China, in 1995 and 1997 respectively, and Ph.D. degree in electrical engineering from University of Missouri – Rolla (currently Missouri University of Science and Technology) in 2000. He has published over 50 IEEE and other technical papers, and holds 5 patents and 5 patent applications. Dr. Ye was Chair of the TC-10 (Signal and Power Integrity Committee) of IEEE EMC Society from 2012-2014. He was also TPC co-chair of the 2014 IEEE international conference on Signal and Power Integrity, and TPC vice chair of the 2015 Symposium on EMC and SI.




Date: Tuesday, May 12, 2015

5:30pm: Networking/light dinner
6:30pm: Presentation
7:45pm: Adjourn

Water and soft drinks are free. Light dinner is available for a small fee.

Location: SIEMIC test lab

Title

Introduction to Antenna Calibration Methods: An overview of new antenna developments, related standards, calibration and what you need to know for efficient and compliant EMC testing

Speaker

Doug Kramer, ETS-Lindgren

Abstract

This presentation will provide an overview on antenna calibration, what it means to calibrate an antenna and why you should care. The set of operations for an antenna calibration that establish the relationship between values of quantities indicated by a measuring instrument and a reference standard will be explained. Essential concepts will be reviewed, such as metrology, verification, validation, and accreditation. Case studies will be provided on these concepts to provide practical examples of the concepts as applicable in the real-world. Finally, traceability and measurement uncertainty will be discussed according to standards such as ANSI C63.5, SAE ERP 958, IEEE 291, and CISPR 16-1-6. The presentation will conclude with a review of new antenna developments, including tips on which antenna to use for what measurement application, trade-offs in evaluating different antennas, and the new "balance test" for biconilog antennas.

Biography

Doug Kramer

Doug Kramer is the Manager of the Calibration/EMC/Wireless Labs for ETS-Lindgren in Cedar Park, Texas. He has over 12 years of experience in managing a commercial test laboratory and providing test solutions to a variety of customers. He holds BSEE and MSEE degrees in Electrical Engineering from the University of Nebraska-Lincoln and is the outgoing Chair of TC1 of the IEEE EMC Society. Doug supports the technical staff at ETS-Lindgren, many of whom are active contributors to the leading wireless industry organizations, including the WiMAX Forum®, CTIA – The Wireless Association®, 3GPP, and the Wi-Fi Alliance®. Prior to joining ETS-Lindgren, Doug was the General Manager for the Nebraska Center for Excellence in Electronics (NCEE), the only full service EMC, environmental and safety product testing facility in Nebraska. He is a contract Senior Assessor to ISO/IEC 17025 and is an iNARTE certified EMC Engineer, a member of the CISPR B working group and Vice Chair of the ANSI C63.5 working group.