Summer break: June - August
Date: Tuesday, September 08, 2015
5:30pm: Networking/light dinner
Water and soft drinks are free. Light dinner is available for a small fee.
Location: CETECOM Inc.
Very-Near-Field Solutions to EMC Compliance Problems - Real World Case Study
Ruska Patton, EMSCAN Corporation
While chambers are the required tool for compliance testing, they are not the best tool to use for debugging when a device fails. Chambers offer limited capability to diagnose root causes and the corrective iteration cycle is long and costly. Systematic problem isolation of components can be effective but it is slow and does not always deliver a resolution. An alternate method is using a very-near-field scanner. A near-field scanning system can offer insightful diagnostics and when used early in product design it can improve pre-compliance preparation. This presentation will show how the diagnostic capability of very-near-field scanning can be used to solve problems at a board level using a real world case study
Ruska Patton is responsible for the evolution of EMSCAN's real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.