Date: August 07-11, 2017
Date: Thursday, October 12, 2017
Date: Tuesday, April 11, 2017
5:30pm: Networking/light dinner
Water and soft drinks are free. Food is available for a small fee.
Statistical Process Control (SPC) for an EMC Laboratory
Measurement system variability in a test laboratory can be a source of discomfort for the test engineer, the designer and management. This is especially true in product development laboratories where the question of exactly what effect a design change had on system behavior is of central interest. The use of Statistical Process Control (SPC) methods to gage and track the variability of system measurements can provide confidence in the repeatability of the system setup, and in the data it produces. However, the use of SPC in an EMC Lab, especially for frequency domain measurements, requires decisions to limit the quantity of the data to avoid information overload. To accomplish this careful selection of the measurement methods is essential.
Kimball Williams completed his career and retired from DENSO as a " Technical Fellow " in 2012 after managing its EMC Test Laboratory. He is an iNARTE certified Master EMC Design Engineer, EMC Test Engineer and ESD Test Engineer with Lifetime certification from iNARTE. Kim is also an IEEE Senior Life Member and Past Chair of the IEEE Southeastern Michigan Section and an ' Honored Member ' of the IEEE EMC Society where he serves as one of the Past Presidents Emeritus and current Director of Professional Activities. Kim is a licensed private pilot, PADDY certified scuba diver, licensed amateur radio operator (Call sign: N8FNC) and plays classical guitar in his ' spare ' time.