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Upcoming Events:


NOTICE: IEEE members who would like to get their membership elevated to Senior Member can contact Caroline Chan . We can help you find Senior member references. For more information, refer to these links: Link 1 and Link 2.

Date: Tuesday, February 9, 2016

5:30pm: Networking/light dinner
6:30pm: Presentation
7:45pm: Adjourn

Water and soft drinks are free. Food is available for a small fee.

Location: 7layers

Title

Introduction to Antenna Pattern Measurement

Speaker

Michael Foegelle, ETS-Lindgren

Abstract

While antenna pattern measurements have been a common fixture in the defense and aerospace industries for almost fifty years, the proliferation of wireless devices over the past fifteen years have made antenna pattern measurements almost commonplace. In the EMC industry where test systems are equipped with turntables for rotating the device under test, it’s not uncommon to obtain simple azimuth cut antenna patterns from such a system. However, extending that to full spherical antenna pattern measurement requires a bit more consideration. This presentation will introduce the various concepts of antenna patterns and antenna pattern measurements, including common system components. These techniques are the basis for passive antenna pattern measurement used by antenna designers as well as active antenna pattern measurements used for wireless device performance testing.

Biography

Michael Foegelle

Dr. Michael D. Foegelle is the Director of Technology Development at ETS-Lindgren in Cedar Park, Texas, and has more than 20 years of test and measurement experience in RF and wireless. He received his Ph.D. in physics from the University of Texas at Austin. Dr. Foegelle has been actively involved in standards development on the American National Standards Institute (ANSI) Accredited Standards Committee C63 on electromagnetic compatibility, CTIA Certification Program Working Group, Wi-Fi Alliance, WiMAX Forum, IEEE 802.11, and 3GPP. He has served as chair or vice-chair of various working groups in those organizations and currently co-chairs the joint CTIA/Wi-Fi Alliance Converged Wireless Group and the CTIA OTA Measurement Uncertainty Subgroup. He has authored or co-authored numerous papers in the areas of Electromagnetics, EMC, Wireless Performance Testing, and Condensed Matter Physics, holds several patents on wireless and electromagnetic test methods and equipment, and is dedicated to advancing the state of the art in radiated RF testing of emerging wireless technologies.