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Date: February 05, 2019

6:15pm: Complimentary dinner and beverages
7:10pm: Welcome and Announcements
7:15pm: Presentation
9:00pm: Adjourn

Location: Siemic


Click here to register now on line. Please register by February 1 to ensure adequate seating and dinner is available for all. Thank you!


Two Common PCB Layout Errors that Cause Automotive Products to Fail to Meet EMC Requirements


Todd Hubing


It is possible to design and build automotive components and systems that consistently meet their EMC requirements on the first test pass. In fact, this is the norm at several automotive companies. Nevertheless, many automotive products do not meet all of their EMC requirements on the first test pass. Patching and tweaking these designs to be compliant can result in products that are less robust and more expensive than they need to be. Automotive products that fail to meet their EMC requirements generally fall into two categories: products with poorly laid-out boards and products with well laid-out boards that have one or two critical errors. This presentation describes two common PCB layout errors that, in the author’s experience, are most likely to cause an otherwise good automotive design to fail to meet its EMC requirements.

EMC and Wireless Test and Measurement: Challenges and Solutions for Connected Vehicles


Garth D’Abreu, ETS-Lindgren


In the rapidly evolving industry of autonomous, electric and hybrid vehicles, the ability to successfully provide vehicle level antenna pattern measurements as well as EMC measurements to verify the performance of Advanced Driver Assistance Systems (ADAS) will be key to the future of this market and address public safety concerns. The automotive trends in wireless capabilities for high data streaming, incident detection warning, anti-collision/adaptive cruise control radar, wireless entry and vehicle-to-vehicle (V2V), vehicle-to-infrastructure (V2I) and vehicle-to-cloud (V2C) communication are just a few of the features impacting the functionality of today’s modern vehicles. This presentation details the challenges presented by these market demands and how innovative testing solutions help drive the technologies forward to real-life applications.


Todd Hubing

Dr. Todd Hubing is a Professor Emeritus of Electrical and Computer Engineering at Clemson University and President of LearnEMC. LearnEMC provides EMC instruction, consulting and design assistance to engineers working in the automotive, aerospace and consumer electronics industries. Dr. Hubing holds a BSEE degree from MIT, an MSEE degree from Purdue University and a Ph.D. from North Carolina State University. He was an engineer at IBM for 7 years and a faculty member at the University of Missouri-Rolla for 17 years before joining Clemson University in 2006. As the Michelin Professor of Vehicle Electronics at Clemson, he directed research in the Clemson Vehicular Electronics Laboratory and taught classes in vehicle electronics, electromagnetic compatibility and digital signal integrity. Dr. Hubing has authored or co-authored over 200 papers and presentations on electromagnetic modeling, electromagnetic compatibility and the design of reliable electronic systems. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), a Fellow of the Applied Computational Electromagnetics Society, and a Past-President of the IEEE Electromagnetic Compatibility Society.

Garth D’Abreu

Mr. Garth D’Abreu is the Director, Automotive Solutions at ETS-Lindgren based at the corporate headquarters office in Cedar Park, Texas. He has primary responsibility for the design and development functions worldwide within the Systems Engineering group, specializing in turnkey solutions for Automotive EMC and Wireless test integration. Some of these more complex full vehicle and electronic sub-assembly (ESA) test chambers involve his coordination with the RF engineering team on custom components, and the certified, internal Building Information Modeling (BIM) team at ETS-Lindgren. Due to his considerable industry experience, he is the ETS-Lindgren global subject matter expert responsible for the ongoing research and development of Automotive EMC/Wireless test chambers for Regular, Autonomous, Electric and Hybrid Electric Vehicles, focusing on combination anechoic chambers, reverberation chambers, GTEM cells, EMP protection applications and wireless device (antenna measurement) test systems. Mr. D’Abreu is a member of the IEEE EMC Society and active participant in standards development, including the SAE, ISO and CISPR D automotive EMC standards, with over 25 years of experience in the RF industry. He holds a BSc degree in Electronics & Communications Engineering, from North London University, UK.